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Applied Scanning Probe Methods I - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2004 edition
Applied Scanning Probe Methods I - NanoScience and Technology
This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.
476 pages, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2010年12月6日 |
| ISBN13 | 9783642056024 |
| 出版商 | Springer-Verlag Berlin and Heidelberg Gm |
| 页数 | 476 |
| 商品尺寸 | 150 × 220 × 10 mm · 842 g |
| 语言 | 德语 |
| 编辑 | Bhushan, Bharat |
| 编辑 | Fuchs, Harald |
| 编辑 | Hosaka, Sumio |