Seismic Processing and Imaging with Diffractions: Theory and Application - Sergius Dell - 图书 - Südwestdeutscher Verlag für Hochschulsch - 9783838133119 - 2012年9月10日
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Seismic Processing and Imaging with Diffractions: Theory and Application

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元 444
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远程仓调货

预计送达时间 年6月15日 - 年6月25日
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Reflected and diffracted waves have different nature and role in the applied seismics. Diffractions itself can be classified in both real seismic and hypothetical diffractions. The real seismic diffractions are seismic waves which are scattered on small heterogeneities in the subsurface or diffracted at the edges and tips, and recorded as the diffracted part of the whole wavefield. To image objects beyond the classical Rayleigh limit, it is indispensable to use real seismic diffractions. The hypothetical diffractions are mathematical constructions resulting from Huygens principle which helps to correctly image reflected events. These Huygens diffractions build a kernel of seismic reflection imaging, particularly, Kirchhoff migration. The migrated data represent pure reflected data with a higher resolution. Considering either real or Huygens diffractions allows to adjust seismic tools for particular needs depending on the interpreter's goal and the geological interpretation. The book is intended for all who want to have a look at non-conventional seismic methods.

介质类型 图书     Paperback Book   (平装胶订图书)
已发行 2012年9月10日
ISBN13 9783838133119
出版商 Südwestdeutscher Verlag für Hochschulsch
页数 152
商品尺寸 150 × 9 × 226 mm   ·   231 g
语言 英语  

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