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Advanced VLSI Design and Testability Issues 第1 版本
价格
元 496
不含税
远程仓调货
预计送达时间 年6月10日 - 年6月26日
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其他版本：
Advanced VLSI Design and Testability Issues
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
360 pages, 29 Tables, black and white; 192 Illustrations, black and white
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2022年4月15日 |
| ISBN13 | 9780367538361 |
| 出版商 | Taylor & Francis Ltd |
| 页数 | 360 |
| 商品尺寸 | 154 × 234 × 35 mm · 570 g |
| 语言 | 英语 |
| 编辑 | Mohapatra, Sushanta Kumar (Kalinga Institute of Industrial Technology, India.) |
| 编辑 | Saxena, Sobhit (Lovely Professional University University, India.) |
| 编辑 | Tripathi, Suman Lata (Lovely Professional University, India) |
