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MOS Interface Physics, Process and Characterization Shengkai Wang
价格
元 540
不含税
远程仓调货
预计送达时间 年6月4日 - 年6月22日
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其他版本：
MOS Interface Physics, Process and Characterization
Shengkai Wang
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
162 pages, 1 Tables, black and white; 97 Line drawings, black and white; 26 Halftones, black and whi
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2024年1月29日 |
| ISBN13 | 9781032106281 |
| 出版商 | Taylor & Francis Ltd |
| 页数 | 162 |
| 商品尺寸 | 150 × 220 × 10 mm · 453 g |
| 语言 | 英语 |
