Adam Foster
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition

Name: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
Price: 1080 CNY
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Author: Adam Foster

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology

Adam Foster

Softcover reprint of hardcover 1st ed. 2006 edition

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

282 pages, biography

介质类型	图书 Paperback Book (平装胶订图书)
已发行	2010年11月23日
ISBN13	9781441923066
出版商	Springer-Verlag New York Inc.
页数	282
商品尺寸	155 × 235 × 16 mm · 417 g
语言	英语