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Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis Joseph Goldstein Softcover reprint of the original 1st ed. 1975 edition
Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis
Joseph Goldstein
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
582 pages, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2011年10月12日 |
| ISBN13 | 9781461344247 |
| 出版商 | Springer-Verlag New York Inc. |
| 页数 | 582 |
| 商品尺寸 | 155 × 235 × 31 mm · 834 g |
| 语言 | 英语 |
| 编辑 | Goldstein, Joseph |
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