Joseph Goldstein
Scanning Electron Microscopy and X Ray Microanalysis Joseph Goldstein 3rd ed. 2003. Softcover reprint of the original 3r edition

Name: Scanning Electron Microscopy and X Ray Microanalysis
Price: 798 CNY
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Author: Joseph Goldstein

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Scanning Electron Microscopy and X Ray Microanalysis

Joseph Goldstein

3rd ed. 2003. Softcover reprint of the original 3r edition

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

709 pages, biography

介质类型	图书 Book
已发行	2013年5月31日
ISBN13	9781461349693
出版商	Springer-Verlag New York Inc.
页数	689
商品尺寸	255 × 182 × 43 mm · 1,22 kg
语言	英语