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Quantitative X-Ray Diffractometry Lev S. Zevin Softcover reprint of the original 1st ed. 1995 edition
Quantitative X-Ray Diffractometry
Lev S. Zevin
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases.
398 pages, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2011年12月27日 |
| ISBN13 | 9781461395379 |
| 出版商 | Springer-Verlag New York Inc. |
| 页数 | 372 |
| 商品尺寸 | 170 × 244 × 20 mm · 630 g |
| 语言 | 英语 |
| 编辑 | Mureinik, Inez |
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