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Ion Beam Surface Layer Analysis: Volume 2 Otto Meyer Softcover reprint of the original 1st ed. 1976 edition
Ion Beam Surface Layer Analysis: Volume 2
Otto Meyer
The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications.
508 pages, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2012年1月30日 |
| ISBN13 | 9781461588818 |
| 出版商 | Springer-Verlag New York Inc. |
| 页数 | 491 |
| 商品尺寸 | 178 × 254 × 26 mm · 879 g |
| 语言 | 英语 |
| 编辑 | Meyer, Otto |
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