分享给好友:
Failure Analysis: High Technology Devices - De Gruyter STEM Daniel J. D. Sullivan
Failure Analysis: High Technology Devices - De Gruyter STEM
Daniel J. D. Sullivan
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
show more
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2022年10月24日 |
| ISBN13 | 9781501524783 |
| 出版商 | De Gruyter |
| 页数 | 128 |
| 商品尺寸 | 150 × 220 × 10 mm · 238 g |
| 语言 | 英语 |