Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Joseph Goldstein - 图书 - Springer Science+Business Media - 9780306472923 - 2003年1月31日
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Third Edition 2003 edition


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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.


709 pages, biography

介质类型 图书     Hardcover Book   (精装硬皮书)
已发行 2003年1月31日
ISBN13 9780306472923
出版商 Springer Science+Business Media
页数 689
商品尺寸 178 × 255 × 38 mm   ·   1,68 kg

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