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2000 European Test Workshop (Etw) IEEE Postproceed Ieee
2000 European Test Workshop (Etw) IEEE Postproceed
Ieee
The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2000年11月1日 |
| ISBN13 | 9780769507019 |
| 出版商 | IEEE Computer Society Press,U.S. |
| 页数 | 181 |
| 商品尺寸 | 216 × 273 × 13 mm · 650 g (预估重量) |
| 语言 | 英语 |