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Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings
Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
514 pages, black & white illustrations
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2014年6月5日 |
| ISBN13 | 9781107409484 |
| 出版商 | Cambridge University Press |
| 页数 | 514 |
| 商品尺寸 | 152 × 229 × 26 mm · 812 g (预估重量) |
| 语言 | 英语 |
| 编辑 | Filter, William F. |
| 编辑 | Frost, Harold J. (Dartmouth College, New Hampshire) |
| 编辑 | Ho, Paul S. (University of Texas, Austin) |
| 编辑 | Rodbell, Kenneth P. (IBM T J Watson Research Center, New York) |
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