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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin Softcover reprint of the original 1st ed. 1986 edition
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
466 pages, 357 black & white illustrations, 7 colour illustrations, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2013年6月8日 |
| ISBN13 | 9781475790290 |
| 出版商 | Springer-Verlag New York Inc. |
| 页数 | 454 |
| 商品尺寸 | 152 × 229 × 24 mm · 630 g |
| 语言 | 英语 |
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