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Structure Analysis of Advanced Nano Oku
Structure Analysis of Advanced Nano
Oku
High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. This book deals with this topic.
178 pages, 94 Illustrations, black and white; 21 Tables, black and white
| 介质类型 | 图书 Book |
| 已发行 | 2014年9月15日 |
| ISBN13 | 9783110304725 |
| 出版商 | De Gruyter |
| 页数 | 178 |
| 商品尺寸 | 177 × 249 × 13 mm · 489 g |
| 语言 | 德语 |
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