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X-Ray Structure Analysis Theo Siegrist
X-Ray Structure Analysis
Theo Siegrist
This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals.
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2021年11月22日 |
| ISBN13 | 9783110610703 |
| 出版商 | De Gruyter |
| 页数 | 250 |
| 商品尺寸 | 170 × 240 × 13 mm · 498 g |
| 语言 | 英语 |
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