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Applied Scanning Probe Methods I - NanoScience and Technology B Bhushan 2004 edition
Applied Scanning Probe Methods I - NanoScience and Technology
B Bhushan
This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.
476 pages, biography
| 介质类型 | 图书 Hardcover Book (精装硬皮书) |
| 已发行 | 2004年1月13日 |
| ISBN13 | 9783540005278 |
| 出版商 | Springer-Verlag Berlin and Heidelberg Gm |
| 页数 | 476 |
| 商品尺寸 | 155 × 235 × 27 mm · 870 g |
| 语言 | 法语 |
| 编辑 | Bhushan, Bharat |
| 编辑 | Fuchs, Harald |
| 编辑 | Hosaka, Sumio |