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Applied Scanning Probe Methods: Characterization - Nanoscience and Technology Donna R. Kemp 1st edition
Applied Scanning Probe Methods: Characterization - Nanoscience and Technology
Donna R. Kemp
Presents 10 chapters on a variety of techniques and refinements of Scanning Probe Methods (SPM) applications.
338 pages, 7 black & white tables, biography
| 介质类型 | 图书 Hardcover Book (精装硬皮书) |
| 已发行 | 2006年10月18日 |
| ISBN13 | 9783540373186 |
| 出版商 | Springer-Verlag Berlin and Heidelberg Gm |
| 页数 | 338 |
| 商品尺寸 | 155 × 235 × 19 mm · 648 g |
| 语言 | 英语 |
| 编辑 | Bhushan, Bharat |
| 编辑 | Fuchs, Harald |
| 编辑 | Kawata, Satoshi |