Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition

Name: Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - NanoScience and Technology
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Hardcover Book (2006) 元 1.051

Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - NanoScience and Technology

Softcover reprint of hardcover 1st ed. 2006 edition

These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

420 pages, 17 black & white tables, biography

介质类型	图书 Paperback Book (平装胶订图书)
已发行	2010年2月12日
ISBN13	9783642065699
出版商	Springer-Verlag Berlin and Heidelberg Gm
页数	420
商品尺寸	155 × 235 × 23 mm · 698 g
语言	德语
编辑	Bhushan, Bharat
编辑	Fuchs, Harald