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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2010年2月12日 |
| ISBN13 | 9783642065965 |
| 出版商 | Springer-Verlag Berlin and Heidelberg Gm |
| 页数 | 378 |
| 商品尺寸 | 155 × 235 × 21 mm · 639 g |
| 语言 | 德语 |
| 编辑 | Bhushan, Bharat |
| 编辑 | Fuchs, Harald |