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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics Hui Xie 2012 edition
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其他版本:
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics
Hui Xie
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
344 pages, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2014年11月26日 |
| ISBN13 | 9783642445019 |
| 出版商 | Springer-Verlag Berlin and Heidelberg Gm |
| 页数 | 344 |
| 商品尺寸 | 155 × 235 × 19 mm · 503 g |
| 语言 | 英语 |