S Morita
Noncontact Atomic Force Microscopy - NanoScience and Technology S Morita Softcover reprint of the original 1st ed. 2002 edition

Name: Noncontact Atomic Force Microscopy - NanoScience and Technology
Price: 1395 CNY
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Author: S Morita

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Noncontact Atomic Force Microscopy - NanoScience and Technology

S Morita

Softcover reprint of the original 1st ed. 2002 edition

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);

458 pages, biography

介质类型	图书 Paperback Book (平装胶订图书)
已发行	2012年10月23日
ISBN13	9783642627729
出版商	Springer-Verlag Berlin and Heidelberg Gm
页数	440
商品尺寸	155 × 235 × 24 mm · 639 g
语言	德语
编辑	Meyer, E.
编辑	Morita, S.
编辑	Wiesendanger, Roland