Compton Profile Study of Technologically Important Materials - Vimal Vyas - 图书 - LAP LAMBERT Academic Publishing - 9783659143557 - 2012年6月12日
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Compton Profile Study of Technologically Important Materials

价格
元 379
不含税

远程仓调货

预计送达时间 年7月7日 - 年7月17日
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The book highlights on the study of Compton Scattering Technique for semiconductors and alloys. Its First chapter is dedicated to Introduction of the techniques and literature survey as well. The second chapter is dedicated to Experimental details of the Compton Spectrometer. Third chapter highlighted the Compton Profile study of semiconducting material ZnSe, then fourth chapter is dedicated to electronic structure study of semiconducting materials AlN. The fifth chapter is devoted to Compton profile study of single crystalline Cu-Zn alloys for both alpha and beta phase in three principal directions. finally, last chapter is dedicated to conclusions and future scope. Overall, the book is well managed in view of science and knowledge. This book is very useful for young researchers in the filed of Condensed Matter Physics.

介质类型 图书     Paperback Book   (平装胶订图书)
已发行 2012年6月12日
ISBN13 9783659143557
出版商 LAP LAMBERT Academic Publishing
页数 160
商品尺寸 150 × 9 × 226 mm   ·   256 g
语言 德语