High Performance Gan Light-emitting Diode: a Reliability Study - Zonglin Li - 图书 - LAP LAMBERT Academic Publishing - 9783844395297 - 2011年5月17日
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Zonglin Li
High Performance Gan Light-emitting Diode: a Reliability Study

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元 314
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预计送达时间 年7月16日 - 年7月28日

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The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.

介质类型 图书     Paperback Book   (平装胶订图书)
已发行 2011年5月17日
ISBN13 9783844395297
出版商 LAP LAMBERT Academic Publishing
页数 80
商品尺寸 150 × 5 × 226 mm   ·   137 g
语言 德语  

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