Recent Interferometry Applications in Topography and Astronomy - Ivan Padron - 图书 - In Tech - 9789535104049 - 2012年3月21日
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Recent Interferometry Applications in Topography and Astronomy

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预计送达时间 年7月20日 - 年7月30日
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This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.


234 pages

介质类型 图书     Hardcover Book   (精装硬皮书)
已发行 2012年3月21日
ISBN13 9789535104049
出版商 In Tech
页数 232
商品尺寸 180 × 260 × 14 mm   ·   571 g
语言 英语  
编辑 Padron, Ivan

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