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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin 1986 edition
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
454 pages, biography
| 介质类型 | 图书 Hardcover Book (精装硬皮书) |
| 已发行 | 1986年3月31日 |
| ISBN13 | 9780306421402 |
| 出版商 | Springer Science+Business Media |
| 页数 | 454 |
| 商品尺寸 | 156 × 234 × 27 mm · 721 g |
| 语言 | 英语 |
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