Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Patrick Echlin - 图书 - Springer Science+Business Media - 9780306421402 - 1986年3月31日
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis 1986 edition


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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.


454 pages, biography

介质类型 图书     Hardcover Book   (精装硬皮书)
已发行 1986年3月31日
ISBN13 9780306421402
出版商 Springer Science+Business Media
页数 454
商品尺寸 156 × 234 × 27 mm   ·   721 g
语言 英语  

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