Said Hamdioui
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns - Frontiers in Electronic Testing Said Hamdioui 2004 edition

Name: Testing Static Random Access Memories: Defects, Fault Models and Test Patterns - Frontiers in Electronic Testing
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Author: Said Hamdioui

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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns - Frontiers in Electronic Testing

Said Hamdioui

2004 edition

Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

221 pages, biography

介质类型	图书 Hardcover Book (精装硬皮书)
已发行	2004年3月31日
ISBN13	9781402077524
出版商	Springer-Verlag New York Inc.
页数	221
商品尺寸	155 × 235 × 14 mm · 526 g
语言	英语