Ullrich Pietsch
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics Ullrich Pietsch 2nd ed. 2004. Softcover reprint of the original 2n edition

Name: High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics
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Author: Ullrich Pietsch

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Hardcover Book

2nd ed. 2004 edition

(2004) 元 1.042

High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics

Ullrich Pietsch

2nd ed. 2004. Softcover reprint of the original 2n edition

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

408 pages, 389 black & white illustrations, biography

介质类型	图书 Paperback Book (平装胶订图书)
已发行	2011年12月12日
ISBN13	9781441923073
出版商	Springer-Verlag New York Inc.
页数	408
商品尺寸	155 × 235 × 22 mm · 594 g
语言	英语