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Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing Michael Nicolaidis 2011 edition
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元 1.310
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预计送达时间 年7月9日 - 年7月27日
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其他版本:
Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing
Michael Nicolaidis
Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.
336 pages, biography
| 介质类型 | 图书 Hardcover Book (精装硬皮书) |
| 已发行 | 2010年9月30日 |
| ISBN13 | 9781441969927 |
| 出版商 | Springer-Verlag New York Inc. |
| 页数 | 318 |
| 商品尺寸 | 155 × 235 × 19 mm · 644 g |
| 语言 | 英语 |
| 编辑 | Nicolaidis, Michael |