分享给好友:
Advances in X-Ray Analysis: Volume 22 Gregory J Mccarthy Softcover reprint of the original 1st ed. 1979 edition
Advances in X-Ray Analysis: Volume 22
Gregory J Mccarthy
In keeping with recent practice, this year's Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.
492 pages, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2012年12月12日 |
| ISBN13 | 9781461399896 |
| 出版商 | Springer-Verlag New York Inc. |
| 页数 | 492 |
| 商品尺寸 | 170 × 244 × 26 mm · 807 g |
| 语言 | 英语 |
| 编辑 | McCarthy, Gregory J. |