High Performance Memory Testing: Design Principles, Fault Modeling and Self-test - Frontiers in Electronic Testing - R. Dean Adams - 图书 - Springer-Verlag New York Inc. - 9781475784749 - 2013年4月26日
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R. Dean Adams
High Performance Memory Testing: Design Principles, Fault Modeling and Self-test - Frontiers in Electronic Testing Softcover Reprint of the Original 1st Ed. 2003 edition

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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

250 pages, biography

介质类型 图书     Paperback Book   (平装胶订图书)
已发行 2013年4月26日
ISBN13 9781475784749
出版商 Springer-Verlag New York Inc.
页数 250
商品尺寸 155 × 235 × 14 mm   ·   376 g
语言 英语  

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