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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Alberto Bosio 2010 edition
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元 716
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预计送达时间 年7月20日 - 年7月30日
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其他版本:
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Alberto Bosio
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.
171 pages, 22 black & white tables, biography
| 介质类型 | 图书 Paperback Book (平装胶订图书) |
| 已发行 | 2014年9月3日 |
| ISBN13 | 9781489983145 |
| 出版商 | Springer-Verlag New York Inc. |
| 页数 | 171 |
| 商品尺寸 | 155 × 235 × 10 mm · 272 g |
| 语言 | 英语 |