Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Manoj Sachdev 2nd ed. 2007 edition

Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing
Price: 1394 CNY
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Author: Manoj Sachdev

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元 1.394

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其他版本：

Paperback Book

Softcover reprint of hardcover 2nd ed. 2007 edition

(2010) 元 1.394

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing

Manoj Sachdev

2nd ed. 2007 edition

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

328 pages, biography

介质类型	图书 Hardcover Book (精装硬皮书)
已发行	2007年6月21日
ISBN13	9780387465463
出版商	Springer-Verlag New York Inc.
页数	328
商品尺寸	155 × 235 × 20 mm · 721 g
语言	英语