Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Manoj Sachdev Softcover reprint of hardcover 2nd ed. 2007 edition

Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing
Price: 1420 CNY
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Author: Manoj Sachdev

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元 1.420

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其他版本：

Hardcover Book

2nd ed. 2007 edition

(2007) 元 1.420

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing

Manoj Sachdev

Softcover reprint of hardcover 2nd ed. 2007 edition

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

328 pages, black & white illustrations

介质类型	图书 Paperback Book (平装胶订图书)
已发行	2010年11月10日
ISBN13	9781441942852
出版商	Springer-Verlag New York Inc.
页数	328
商品尺寸	155 × 235 × 18 mm · 494 g
语言	英语